WE SUPPORT YOU IN ANALYTICAL ISSUES

Smallest objects and structures in the micrometre and nanometre range become visible under a scanning electron microscope (SEM). Topography and material differences can be visualized and examined. The chemical composition is determined by means of Energy-Dispersive X-ray analysis (EDX). This is of particular advantage when analyses of smallest imperfections are required, extremely thin or poorly solvable layers are to be examined or material quantity is not sufficient for a classical chemical analysis.

SEM WITH EDX

  • Display of surfaces, fractured and boundary surfaces, coatings, replicas
  • Magnification 5fold up to 1,000,000fold
  • Examination of conductive and non-conductive specimen in high-vacuum respectively low-vacuum
  • Determination of chemical composition (elements boron to uranium)

CORRELATIVE MICROSCOPY / FAILURE INVESTIGATION

  • Combination of image information from light microscopy and SEM with various detectors
  • Investigation of material failure due to crack, corrosion and wear; visual defects of surfaces and other irregularities
  • Analysis of residuals or deposits

ASSESSMENT OF FILTERS FOR CLEANLINESS ANALYSIS ACCORDING TO VDA BD.19

  • Automated determination of Automated determination of of particles
  • Distinction of reflective and non-reflective particles and non-reflective particles
  • Automated determination of chemical composition of particles by means of SEM/EDX